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Inspection Equipment(IGBT) - List of Manufacturers, Suppliers, Companies and Products

Last Updated: Aggregation Period:Jul 09, 2025~Aug 05, 2025
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Inspection Equipment Product List

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SG Tech IGBT Burn-in Test Equipment (Automotive Related)

We are capable of manufacturing custom inspection equipment for the automotive industry.

- Simultaneous inspection of 356 modules - Set the drawer module by pulling out the shelf and mechanically contact the probe when pushing it into the shelf. - Temperature load of 125 degrees - Varm: 480V / VGE 0V - Inspect leakage current of less than 100μA - Heating for 2 hours → inspection for 2 hours → cooling for 2 hours

  • Other inspection equipment and devices

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Wafer chip standalone dynamic characteristic testing device

This is a dynamic characteristic testing device for measuring power devices in chip form. There are also many proven inspection devices for testing in wafer form.

This is a dynamic characteristic measurement device (AC characteristic measurement device) aimed at individual wafer chips of various semiconductors (IGBT, P-MOS FET, SiC, GaN, Diodes, etc.). It enables dynamic characteristic testing during shipping inspections and acceptance inspections of individual chips, as well as during the process before package sealing.

  • Other electronic measuring instruments

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Power module dynamic characteristic testing device

This is a dynamic characteristic testing device for measuring power devices packaged as modules.

Achieves switching time, VCE (SUS), and load short-circuit measurement with a single unit. Ideal for measuring dynamic characteristics (AC characteristics) in high and low temperature environments. Low Ls measurement is possible thanks to Copel Electronics' unique know-how. Chamber for heating/cooling is also available.

  • Other electronic measuring instruments

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Pulse Output Circuit Board Voltage Waveform Inspection Device

Pulse waveforms can be output freely!! Measured waveforms are beautifully reproduced on the monitor!!

- Editing and rearranging inspection steps is possible on the PC monitor. - Inspections combining different pulse output waveform patterns and power voltages can be performed. - Arbitrary pulse waveforms can be output. - A dedicated measuring device is used for thermal resistance, ensuring high precision (communicates with the thermal resistance meter via GPIB). - All inspection results can be saved in a log file. - Measurement waveforms can be viewed on the PC monitor. - Since it uses a Windows PC, the operation is easy to understand. - Simultaneous measurement on 2 channels is possible, allowing for judgment based on the interrelationship of the measurement waveforms.

  • Circuit Board Inspection Equipment
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Module Static Characteristic Inspection Device

It is a static characteristic testing device for measuring power devices packaged as modules.

It is a static characteristic (DC characteristic) measuring instrument for various power modules. It supports measurements from microcurrents to high power.

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Chip standalone static characteristic testing device

It is a static characteristic testing device for measuring power devices in a chip-only configuration. There are also many proven testing devices for wafer state.

It is a test device for the static characteristics of the chip (DC characteristics). It supports from microcurrents to high power.

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Multifocus X-ray inspection device "Cheetah EVO"

【Exhibition at Nepcon (Booth No. 11-26)】Active in the manufacturing field of semiconductors and electronic components. Supports three mode switches and monochrome expression with 65,536 gradations.

The "Cheetah EVO" is a versatile X-ray inspection device that can be used for a wide range of applications in the production of semiconductors and electronic components. It allows switching between nano-focus, micro-focus, and high-power modes, making it easy to observe electronic components, resin parts, rubber parts, and metal parts, as well as analyze mounted circuit boards. It supports a field of view of 160×160mm and can output monochrome with 65,536 gradations. With its high versatility, it is widely utilized in manufacturing, quality assurance, and development departments, and is also active in semiconductor and electronic component factories, as well as contract analysis companies in the electronics industry. ★ It will be exhibited at "Internepcon Japan," starting on January 25, 2023. 【Features】 ■ High-speed and reproducible inspections are possible ■ Automatic calculation of voids using VoidInspect ■ User-friendly and powerful filters such as eHDR ■ Best laminography with micro3Dslice and FF CT software ■ Dose reduction kit, dose monitoring, and low-dose detector mode for high-sensitivity components ■ Option for a new water-cooled X-ray tube that achieves stable focal position ■ Option to select high load capacity (under 20kg)

  • X-ray inspection equipment

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IGBT/SiC Power Module Inspection Equipment "NATS Series"

Low LS 4.5nH! Introducing Nidec Advance Technology's inspection equipment.

We would like to introduce our IGBT/SiC power module testing equipment, the 'NATS Series'. We offer the automatic testing device "NATS-1000," which achieves low LS values and supports high-precision testing for insulation, static characteristics, and dynamic characteristics, as well as the manual testing device "NATS-1630/1730," which can be integrated with external PCs and upper data management systems such as the cloud. Please feel free to contact us when you need assistance. 【Features】 <NATS-1000> ■ Insulation testing (ISO) ■ Static characteristics testing (DC) ■ Dynamic characteristics testing (AC) ■ High-temperature testing up to 175°C (up to 200°C) ■ High throughput of up to 144 UPH (25 seconds/unit) *For more details, please download the PDF or feel free to contact us.

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Power Module Inspection Device "NSAT Series"

Wide bandgap measurement technology! Achieving high throughput inspection of up to 144 UPH.

We would like to introduce our IGBT/SiC power module testing equipment, the 'NSAT Series'. The "NATS-1000" is an automatic testing device for insulation/static characteristics/dynamic characteristics. It can be expanded for automatic lines and complies with IEC60747 measurements. The "NATS-1630/1730" is a manual testing device for dynamic characteristics, capable of interfacing with higher-level data management systems such as external PCs or the cloud. 【NATS-1000 Features】 ■ High-temperature testing up to 175℃ (up to 200℃) ■ High throughput of up to 144 UPH (25 seconds/unit) ■ Low LS of 4.5nH ■ Expandable for automatic lines ■ Complies with IEC60747 measurements ■ AOI/warp inspection/laser marking *For more details, please download the PDF or feel free to contact us.

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